| 講演要旨： |
Growth, geometrical and electronic structure as well as magnetism of ultrathin films are studied using scattering of fast ions under a grazing angle of incidence. The intensity of reflected projectiles or electron emission allows one to monitor growth of ultrathin films, Auger electron spectroscopy induced by ions serves to inspect the layer-resolved chemical composition in the surface region, ion beam triangulation making use of electron emission provides a powerful tool in studies on the surface structure, and the detection of spin polarized electrons after ion impact as well as the capture of polarized electrons into excited atomic terms are the basis for the investigation of magnetism with high sensitivity to the topmost surface layer. Applications of these techniques to some specific problems in the field of ultrathin metal films is discussed. |
